Semiconductor measurements and instrumentation / W. R. Runyan and T. J. Shaffner.
Material type:![Text](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current location | Call number | Materials specified | Copy number | Status | Date due | Barcode |
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Perpustakaan Ibnu Khaldun General Collection | 621.381520287 RUN 1998 (Browse shelf) | 5458 | Available | 0000006320 | ||
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Perpustakaan Ibnu Khaldun General Collection | 621.381520287 RUN 1998 (Browse shelf) | 6670 | Available | 0000007657 | ||
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Perpustakaan Ibnu Khaldun General Collection | 621.381520287 RUN 1998 (Browse shelf) | 12632 | Available | 0000013674 | ||
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Perpustakaan Ibnu Khaldun General Collection | 621.381520287 RUN 1998 (Browse shelf) | 12633 | Available | 0000013675 | ||
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Perpustakaan Ibnu Khaldun General Collection | 621.381520287 RUN 1998 (Browse shelf) | 12634 | Available | 0000013676 |
Includes index
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