Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach / edited by Yichuang Sun.
Material type:
TextPublisher: London The Institution of Engineering and Technology 2008Description: xx, 389p. ill. 24cmISBN: 9780863417450 Subject(s): Linear integrated circuits -- Testing | Mixed signal circuits -- Testing | Radio frequency integrated circuits -- TestingDDC classification: 621.38150287 TES
| Item type | Current location | Call number | Materials specified | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|---|
Book-GN
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Perpustakaan Ibnu Khaldun General Collection | 621.38150287 TES (Browse shelf) | 50525 | Available | 0000051915 |
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