Semiconductor material and device characterization / Dieter K. Schroder.
Material type:
TextPublisher: New York John Wiley & Sons 1998Edition: 2nd edDescription: 760p. ill. 25cmISBN: 0471241393 Subject(s): Semiconductors | Semiconductors -- TestingDDC classification: 621.38152 SCH 1998
| Item type | Current location | Call number | Materials specified | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|---|
Book-GN
|
Perpustakaan Ibnu Khaldun General Collection | 621.38152 SCH 1998 (Browse shelf) | 5240 | Available | 0000006093 | ||
|
Book-GN
|
Perpustakaan Ibnu Khaldun General Collection | 621.38152 SCH 1998 (Browse shelf) | 15605 | Available | 0000016676 | ||
|
Book-GN
|
Perpustakaan Ibnu Khaldun General Collection | 621.38152 SCH 1998 (Browse shelf) | 15606 | Available | 0000016677 | ||
|
Book-GN
|
Perpustakaan Ibnu Khaldun General Collection | 621.38152 SCH 1998 (Browse shelf) | 15607 | Available | 0000016678 |
"A Wiley-Interscience publication."
Includes bibliographical references and index
There are no comments on this title.