Integrated circuit failure analysis : a guide to preparation techniques / Friedrich Beck; translated by Stephen S. Wilson.
Material type:
TextPublisher: Chichester John Wiley & Sons 1998Description: 173p. ill. 24cmISBN: 0471974013 Subject(s): Semiconductors -- Failures | Semiconductors -- TestingDDC classification: 621.3815 BEC 1998
| Item type | Current location | Call number | Materials specified | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|---|
Book-GN
|
Perpustakaan Ibnu Khaldun General Collection | 621.3815 BEC 1998 (Browse shelf) | 5284 | Available | 0000006142 | ||
|
Book-GN
|
Perpustakaan Ibnu Khaldun General Collection | 621.3815 BEC 1998 (Browse shelf) | 17114 | Available | 0000018194 | ||
|
Book-GN
|
Perpustakaan Ibnu Khaldun General Collection | 621.3815 BEC 1998 (Browse shelf) | 17115 | Available | 0000018195 | ||
|
Book-GN
|
Perpustakaan Ibnu Khaldun General Collection | 621.3815 BEC 1998 (Browse shelf) | 17116 | Available | 0000018196 |
Includes bibliographical references and index
There are no comments on this title.