Latino Root cause analysis : improving performance for bottom-line results / Robert J. Latino, Kenneth C. Latino. - 3rd ed.. - Boca Raton CRC Taylor & Francis 2006. - 266p. ill. 25cm Includes index p.261 - 266 ISBN: 0849353408 Subjects--Topical Terms: Critical incident techniqueIndustrial accidents--InvestigationQuality control--Data processing Dewey Class. No.: 658.562 LAT 2006