Beck  <br/><br/>
Integrated circuit failure analysis : a guide to preparation techniques  
/ Friedrich Beck; translated by Stephen S. Wilson. 
 - Chichester  John Wiley & Sons  1998. 
 - 173p.  ill.  24cm 
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>0471974013  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Failures<br/>Semiconductors--Testing
<br/><br/><label>Dewey Class. No.: </label>621.3815 BEC 1998