000 00676nam a2200217#a 4500
001 0000020242
008 211117s2020||||xx |||||||||||||| ||und||
020 _a047143308X
082 _a621.38224 MON 2004
100 _aMontrose
245 0 _aTesting for EMC compliance : approaches and techniques
_c/ Mark I. Montrose, Edward M. Nakauchi.
260 _aHoboken
_bJohn Wiley & Sons
_c2004.
300 _axviii, 460p.
_bill.
_c24cm
365 _cMYR
500 _aIncludes bibliography and index p.447 - 457
650 _aElectromagnetic compatibility
650 _aElectromagnetic interference
700 _aNakauchi, Edward M.
942 _cBK-GN
999 _c19386
_d19386