Integrated circuit failure analysis : a guide to preparation techniques / Friedrich Beck; translated by Stephen S. Wilson.
Material type: TextPublisher: Chichester John Wiley & Sons 1998Description: 173p. ill. 24cmISBN: 0471974013 Subject(s): Semiconductors -- Failures | Semiconductors -- TestingDDC classification: 621.3815 BEC 1998Item type | Current location | Call number | Materials specified | Copy number | Status | Date due | Barcode |
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Book-GN | Perpustakaan Ibnu Khaldun General Collection | 621.3815 BEC 1998 (Browse shelf) | 5284 | Available | 0000006142 | ||
Book-GN | Perpustakaan Ibnu Khaldun General Collection | 621.3815 BEC 1998 (Browse shelf) | 17114 | Available | 0000018194 | ||
Book-GN | Perpustakaan Ibnu Khaldun General Collection | 621.3815 BEC 1998 (Browse shelf) | 17115 | Available | 0000018195 | ||
Book-GN | Perpustakaan Ibnu Khaldun General Collection | 621.3815 BEC 1998 (Browse shelf) | 17116 | Available | 0000018196 |
Browsing Perpustakaan Ibnu Khaldun shelves, Shelving location: General Collection Close shelf browser
621.3815 BAK 2007 Analog integrated circuits | 621.3815 BAK 2008 Electronic circuits - II | 621.3815 BAL 2008 Linear integrated circuits | 621.3815 BEC 1998 Integrated circuit failure analysis : a guide to preparation techniques | 621.3815 BEC 1998 Integrated circuit failure analysis : a guide to preparation techniques | 621.3815 BEC 1998 Integrated circuit failure analysis : a guide to preparation techniques | 621.3815 BEC 1998 Integrated circuit failure analysis : a guide to preparation techniques |
Includes bibliographical references and index
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